Laser induced fluorescence (LIF) is a very sensitive technique to detect traces of defects or impurities in optical materials and coatings. We have performed laser induced fluorescence (LIF) measurements in bulk optical materials as well as in layers. As an example, the spectrum on the left shows LIF of a 50nm LaF2 single layer on a Si substrate after excitation at 193 nm.

We are able to perform LIF measurements at various excitation wavelengths. In addition, we adapt or develop measurement set-ups according to customer needs.