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Laser-induced absorptionLaser-induced deflection (LID)
The laser induced deflection (LID) technique allows to directly measure absorption in optical materials and coatings. The blue field in the figure below represents the area which is irradiated by a pump laser beam.

- Scheme of measurement principle
Laser-induced deflection (LID)
Even small absorption of laser radiation yields a temperature profile in the sample. The related refractive index profile is used to deflect a probe laser beam (red line) from its original direction.

- Dielectric mirror HR(532 nm)-0° inside the LID set-up
Absolute absorption data are obtained by electrical calibration. The LID technique allows to separate absorption by bulk material from that by coatings/surfaces using one single small sample. The high LID sensitivity allows to measure absorption down to the ppm range.
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A Novel Method to Measure Bulk Absorption in Optically Transparent Materials
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Direct Measurements of Residual Absorption in fluoridic thin films and optical materials for DUV laser applications PDF-Download (252 kB)
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Dr. Wolfgang Paa
Fon +49 (0) 3641 · 206 411
Fax +49 (0) 3641 · 206 499

